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AY2018/2019 Semester 2
Virtual Device Characterization. Transistor Parameter Extraction. Circuit Simulation and Mask Layout Design.
| AUs | 2.0 AUs |
| Categories | Core |
| Mutually Exclusive With | EE4611, EE4612 |
| Exam |
| Mon | Tue | Wed | Thu | Fri | |
|---|---|---|---|---|---|
| 1330 | COMMON LEC (F61) 1330-1630 Tue S1-B2B-13 | ||||
| 1400 | |||||
| 1430 | |||||
| 1500 | |||||
| 1530 | |||||
| 1600 |
