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AY2014/2015 Semester 2
Virtual Device Characterization. Transistor Parameter Extraction. Circuit Simulation and Mask Layout Design.
| AUs | 2.0 AUs |
| Categories | Core |
| Mutually Exclusive With | EE4611, EE4612 |
| Exam |
| Mon | Tue | Wed | Thu | Fri | |
|---|---|---|---|---|---|
| 930 | COMMON LEC (F61) 0930-1230 Wed S1-B2B-13 | ||||
| 1000 | |||||
| 1030 | |||||
| 1100 | |||||
| 1130 | |||||
| 1200 |
