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AY2017/2018 Semester 1
Basic reliability engineering concept. Statistical aspect of reliability and data handling. Microelectronic device failure mechanisms. Failure analysis techniques and instrumentation.
| AUs | 3.0 AUs |
| Categories | Core |
| Mutually Exclusive With | E494N |
| Exam |
| Mon | Tue | Wed | Thu | Fri | |
|---|---|---|---|---|---|
| 1130 | COMMON LEC (LE) 1130-1230 Thu TR102 | COMMON LEC (LE) 1130-1230 Fri TR102 | |||
| 1200 | |||||
| 1230 | |||||
| 1300 | |||||
| 1330 | |||||
| 1400 | |||||
| 1430 | |||||
| 1500 | |||||
| 1530 | 34083 TUT (F61) 1530-1630 Fri TR102 Wk2-13 | ||||
| 1600 |
