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AY2014/2015 Semester 2
Lithography, etching and additive techniques. Micromachining. Advanced metrology. Overview of nanotechnology. Nanometrology. Emerging tehniques in nanomanufacturing.
| AUs | 3.0 AUs |
| Categories | Core |
| Not Available To Programme | ME(DES)(2011-onwards)(Non Direct Entry), ME(DES)(2012-onwards)(Direct Entry), ME(MEC)(2011-onwards)(Non Direct Entry), ME(MEC)(2012-onwards)(Direct Entry) |
| Not Available To All Programme With | (Admyr 2012-onwards) |
| Not Available As Core To Programme | ENG, ME 2, ME(DES) 2, ME(DES) 3, ME(DES) 4, ME(MEC) 2, ME(MEC) 3, ME(MEC) 4, MEEC 2, MEEC(DES) 2, MEEC(DES) 3, MEEC(DES) 4, MEEC(DES) 5, MEEC(MEC) 2, MEEC(MEC) 3, MEEC(MEC) 4, MEEC(MEC) 5 |
| Exam |
| Mon | Tue | Wed | Thu | Fri | ||
|---|---|---|---|---|---|---|
| 1900 | COMMON LEC (LE) 1900-2200 Tue LT14 | COMMON LEC (PLE) 1900-2200 Tue LT14 | ||||
| 1930 | ||||||
| 2000 | ||||||
| 2030 | ||||||
| 2100 | ||||||
| 2130 | ||||||
